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In integrated photonics, specific wavelengths such as 1,550 nm are preferred due to low-loss transmission and the availability of optical gain in this spectral region. For chip-based photodetectors, two-dimensional materials bear scientifically and technologically relevant properties such as electrostatic tunability and strong light–matter interactions. However, no efficient photodetector in the telecommunication C-band has been realized with two-dimensional transition metal dichalcogenide materials due to their large optical bandgaps. Here we demonstrate a MoTe2-based photodetector featuring a strong photoresponse (responsivity 0.5 A W–1) operating at 1,550 nm in silicon photonics enabled by strain engineering the two-dimensional material. Non-planarized waveguide structures show a bandgap modulation of 0.2 eV, resulting in a large photoresponse in an otherwise photoinactive medium when unstrained. Unlike graphene-based photodetectors that rely on a gapless band structure, this photodetector shows an approximately 100-fold reduction in dark current, enabling an efficient noise-equivalent power of 90 pW Hz–0.5. Such a strain-engineered integrated photodetector provides new opportunities for integrated optoelectronic systems. 

A bstract We present a measurement of the Cabibbo-Kobayashi-Maskawa unitarity triangle angle ϕ 3 (also known as γ ) using a model-independent Dalitz plot analysis of B + → D ( $$ {K}_S^0 $$ K S 0 h + h − ) h + , where D is either a D 0 or $$ \overline{D} $$ D ¯ 0 meson and h is either a π or K . This is the first measurement that simultaneously uses Belle and Belle II data, combining samples corresponding to integrated luminosities of 711 fb − 1 and 128 fb − 1 , respectively. All data were accumulated from energy-asymmetric e + e − collisions at a centre-of-mass energy corresponding to the mass of the Υ(4 S ) resonance. We measure ϕ 3 = (78 . 4 ± 11 . 4 ± 0 . 5 ± 1 . 0)°, where the first uncertainty is statistical, the second is the experimental systematic uncertainty and the third is from the uncertainties on external measurements of the D -decay strong-phase parameters.